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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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Metal Impurities in Silicon- and Germanium-Based Technologies - Origin, Characterization, Control, and Device Impact (Paperback, Softcover reprint of the original 1st ed. 2018) Loot Price: R5,000
Discovery Miles 50 000
Repayment Terms: R469 pm x 12*
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Metal Impurities in Silicon- and Germanium-Based Technologies - Origin, Characterization, Control, and Device Impact...

Metal Impurities in Silicon- and Germanium-Based Technologies - Origin, Characterization, Control, and Device Impact (Paperback, Softcover reprint of the original 1st ed. 2018)

Cor Claeys, Eddy Simoen

Series: Springer Series in Materials Science, 270

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Loot Price R5,000 Discovery Miles 50 000 | Repayment Terms: R469 pm x 12*

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This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices' performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

General

Imprint: Springer Nature Switzerland AG
Country of origin: Switzerland
Series: Springer Series in Materials Science, 270
Release date: 2019
First published: 2018
Authors: Cor Claeys • Eddy Simoen
Dimensions: 235 x 155 x 24mm (L x W x T)
Format: Paperback
Pages: 438
Edition: Softcover reprint of the original 1st ed. 2018
ISBN-13: 978-3-03-006747-2
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
LSN: 3-03-006747-5
Barcode: 9783030067472

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