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Books > Science & Mathematics > Physics > Classical mechanics > Sound, vibration & waves (acoustics)
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High Frequency Measurements and Noise in Electronic Circuits (Hardcover, 1993 ed.)
Loot Price: R5,773
Discovery Miles 57 730
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High Frequency Measurements and Noise in Electronic Circuits (Hardcover, 1993 ed.)
Expected to ship within 12 - 19 working days
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This ready reference provides electrical engineers with practical
information on accurate methods for measuring signals and noise in
electronic circuits as well as methods for locating and reducing
high frequency noise generated by circuits or external
interference. Engineers often find that measuring and mitigating
high frequency noise signals in electronic circuits can be
problematic when utilizing common measurement methods.
Demonstrating the innovative solutions he developed as a
Distinguished Member of Technical Staff at AT&T/Bell
Laboratories, solutions which earned him numerous U.S. and foreign
patents, Douglas Smith has written the most definitive work on this
subject. Smith explains design problems related to the new high
frequency electronic standards, and then systematically provides
laboratory proven methods for making accurate noise measurements,
while demonstrating how these results should be interpreted. The
technical background needed to conduct these experiments is
provided as an aid to the novice, and as a reference for the
professional. Smith also discusses theoretical concepts as they
relate to practical applications. Many of the techniques Smith
details in this book have been previously unpublished, and have
been proven to solve problems in hours rather than in the days or
weeks of effort it would take conventional techniques to yield
results. Comprehensive and informative, this volume provides
detailed coverage of such areas as: scope probe impedance,
grounding, and effective bandwidth, differential measurement
techniques, noise source location and identification, current probe
characteristics, operation, and applications, characteristics of
sources of interferenceto measurements and the minimization of
their effects, minimizing coupling of external noise into the
equipment under test by measurements, estimating the effect of a
measurement on equipment operation, using digital scopes for single
shot noise measurements, prediction of equipment electromagnetic
interference (EMI) emission and susceptibility of performance, null
experiments for validating measurement data, the relationship
between high frequency noise and final product reliability. With
governmental regulations and MIL standards now governing the
emission of high frequency electronic noise and the susceptibility
to pulsed EMI, the information presented in this guide is extremely
pertinent. Electrical engineers will find High Frequency
Measurements and Noise in Electronic Circuits an essential desktop
reference for information and solutions, and engineering students
will rely on it as a virtual source book for deciphering the
"mysteries" unique to high frequency electronic circuits.
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