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Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Industrial quality control

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Digital Integrated Circuit Testing from a Quality Perspective (Hardcover, 1993 ed.) Loot Price: R3,133

Discovery Miles 31 330

Repayment Terms: R294 pm x 12*

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Digital Integrated Circuit Testing from a Quality Perspective (Hardcover, 1993 ed.): Eugene R. Hnatek

Digital Integrated Circuit Testing from a Quality Perspective (Hardcover, 1993 ed.)

Eugene R. Hnatek

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Loot Price R3,133 Discovery Miles 31 330 | Repayment Terms: R294 pm x 12*

Expected to ship within 10 - 15 working days

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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

General

Imprint:	Van Nostrand Reinhold Inc.,U.S.
Country of origin:	United States
Release date:	August 1993
First published:	1993
Authors:	Eugene R. Hnatek
Dimensions:	234 x 156 x 12mm (L x W x T)
Format:	Hardcover
Pages:	180
Edition:	1993 ed.
ISBN-13:	978-0-442-00643-3
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Industrial quality control Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Promotions
LSN:	0-442-00643-8
Barcode:	9780442006433