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Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Industrial quality control

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Digital Integrated Circuit Testing from a Quality Perspective (Hardcover, 1993 ed.) Loot Price: R2,752
Discovery Miles 27 520
Digital Integrated Circuit Testing from a Quality Perspective (Hardcover, 1993 ed.): Eugene R. Hnatek

Digital Integrated Circuit Testing from a Quality Perspective (Hardcover, 1993 ed.)

Eugene R. Hnatek

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Loot Price R2,752 Discovery Miles 27 520 | Repayment Terms: R258 pm x 12*

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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

General

Imprint: Van Nostrand Reinhold Inc.,U.S.
Country of origin: United States
Release date: August 1993
First published: 1993
Authors: Eugene R. Hnatek
Dimensions: 234 x 156 x 12mm (L x W x T)
Format: Hardcover
Pages: 180
Edition: 1993 ed.
ISBN-13: 978-0-442-00643-3
Categories: Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Industrial quality control
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 0-442-00643-8
Barcode: 9780442006433

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