Surface and Thin Film Analysis 2e - A Compendium of Principles, Instrumentation and Applications (Hardcover, 2nd, Completely Revised And Enlarged Edition)

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP), and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
From a Review of the First Edition (edited by Bubert and Jenett)
..". a useful resource..."
(Journal of the American Chemical Society)

General

Imprint:	Wiley-VCH Verlag GmbH
Country of origin:	Germany
Release date:	April 2011
First published:	June 2011
Authors:	G Friedbacher
Dimensions:	247 x 180 x 32mm (L x W x T)
Format:	Hardcover
Pages:	558
Edition:	2nd, Completely Revised And Enlarged Edition
ISBN-13:	978-3-527-32047-9
Categories:	Books > Professional & Technical > Mechanical engineering & materials > General Promotions
LSN:	3-527-32047-4
Barcode:	9783527320479

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