Crystal structure analysis from powder diffraction data has
attracted considerable and ever growing interest in the last
decades. X-ray powder diffraction is best known for phase analysis
(Hanawalt files) dating back to the 30s. In the late 60s the
inherent potential of powder diffraction for crystallographic
problems was realized and scientists developed methods for using
powder diffraction data at first only for the refinement of crystal
structures. With the development of ever growing computer power
profile fitting and pattern decomposition allowed to extract
individual intensities from overlapping diffraction peaks opening
the way to many other applications, especially to ab initio
structure determination.
Powder diffraction today is used in X-ray and neutron
diffraction, where it is a powerful method in neutron diffraction
for the determination of magnetic structures. In the last decade
the interest has dramatically improved. There is hardly any field
of crystallography where the Rietveld, or full pattern method has
not been tried with quantitative phase analysis the most important
recent application.
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