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Defect and Fault Tolerance in VLSI Systems - Volume 1 (Paperback, Softcover reprint of the original 1st ed. 1989) Loot Price: R2,422
Discovery Miles 24 220
Defect and Fault Tolerance in VLSI Systems - Volume 1 (Paperback, Softcover reprint of the original 1st ed. 1989): Israel Koren

Defect and Fault Tolerance in VLSI Systems - Volume 1 (Paperback, Softcover reprint of the original 1st ed. 1989)

Israel Koren

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Loot Price R2,422 Discovery Miles 24 220 | Repayment Terms: R227 pm x 12*

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This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized."

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: June 2012
First published: 1989
Authors: Israel Koren
Dimensions: 254 x 178 x 19mm (L x W x T)
Format: Paperback
Pages: 362
Edition: Softcover reprint of the original 1st ed. 1989
ISBN-13: 978-1-4615-6801-8
Categories: Books > Computing & IT > Computer programming > General
LSN: 1-4615-6801-3
Barcode: 9781461568018

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