This book contains an edited selection of papers presented at the
International Workshop on Defect and Fault Tolerance in VLSI
Systems held October 6-7, 1988 in Springfield, Massachusetts. Our
thanks go to all the contributors and especially the members of the
program committee for the difficult and time-consuming work
involved in selecting the papers that were presented in the
workshop and reviewing the papers included in this book. Thanks are
also due to the IEEE Computer Society (in particular, the Technical
Committee on Fault-Tolerant Computing and the Technical Committee
on VLSI) and the University of Massachusetts at Amherst for
sponsoring the workshop, and to the National Science Foundation for
supporting (under grant number MIP-8803418) the keynote address and
the distribution of this book to all workshop attendees. The
objective of the workshop was to bring t. ogether researchers and
practition ers from both industry and academia in the field of
defect tolerance and yield en ha. ncement in VLSI to discuss their
mutual interests in defect-tolerant architectures and models for
integrated circuit defects, faults, and yield. Progress in this
area was slowed down by the proprietary nature of yield-related
data, and by the lack of appropriate forums for disseminating such
information. The goal of this workshop was therefore to provide a
forum for a dialogue and exchange of views. A follow-up workshop in
October 1989, with C. H. Stapper from IBM and V. K. Jain from the
University of South Florida as general co-chairmen, is being
organized."
General
Imprint: |
Springer-Verlag New York
|
Country of origin: |
United States |
Release date: |
June 2012 |
First published: |
1989 |
Authors: |
Israel Koren
|
Dimensions: |
254 x 178 x 19mm (L x W x T) |
Format: |
Paperback
|
Pages: |
362 |
Edition: |
Softcover reprint of the original 1st ed. 1989 |
ISBN-13: |
978-1-4615-6801-8 |
Categories: |
Books >
Computing & IT >
Computer programming >
General
|
LSN: |
1-4615-6801-3 |
Barcode: |
9781461568018 |
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