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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics

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Advances in Imaging and Electron Physics, Volume 173 - Part B (Hardcover, New) Loot Price: R3,977

Discovery Miles 39 770

Repayment Terms: R373 pm x 12*

You Save: R1,429 (26%)

Advances in Imaging and Electron Physics, Volume 173 - Part B (Hardcover, New): Jay Theodore Cremer Jr

Advances in Imaging and Electron Physics, Volume 173 - Part B (Hardcover, New)

Jay Theodore Cremer Jr

Series: Advances in Imaging and Electron Physics

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List price ~~R5,406~~ Loot Price R3,977 Discovery Miles 39 770 | Repayment Terms: R373 pm x 12* You Save R1,429 (26%)

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This special volume of "Advances in Imaging and Electron Physics "details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	September 2012
First published:	August 2012
Volume editors:	Jay Theodore Cremer Jr
Dimensions:	229 x 152 x 30mm (L x W x T)
Format:	Hardcover
Pages:	540
Edition:	New
ISBN-13:	978-0-12-396969-9
Categories:	Books > Science & Mathematics > Physics > Optics (light) Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General Books > Academic & Education > Professional & Technical > Physics Promotions
LSN:	0-12-396969-7
Barcode:	9780123969699