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Advances in X-Ray Analysis - Volume 36 (Paperback, Softcover reprint of the original 1st ed. 1993) Loot Price: R1,743
Discovery Miles 17 430
Advances in X-Ray Analysis - Volume 36 (Paperback, Softcover reprint of the original 1st ed. 1993): John V. Gilfrich, Ting C....

Advances in X-Ray Analysis - Volume 36 (Paperback, Softcover reprint of the original 1st ed. 1993)

John V. Gilfrich, Ting C. Huang, C R Hubbard, M. R James, Ron Jenkins, G.R. Lachance, Deane K. Smith

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Loot Price R1,743 Discovery Miles 17 430 | Repayment Terms: R163 pm x 12*

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The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these "leading-edge" developments, the topic for the Plenary Session was "Grazing-Incidence X Ray Characterization of Materials. " The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K., opened the session with a lecture on "Grazing Incidence X-Ray Scattering from Thin Films. " He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on "Grazing Incidence Diffuse X-Ray Scattering from Thin Films. " He concentrated on the use of newly developed "off-specular" reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces."

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: March 2013
First published: 1993
Editors: John V. Gilfrich • Ting C. Huang • C R Hubbard • M. R James • Ron Jenkins • G.R. Lachance • Deane K. Smith
Dimensions: 254 x 178 x 36mm (L x W x T)
Format: Paperback
Pages: 685
Edition: Softcover reprint of the original 1st ed. 1993
ISBN-13: 978-1-4613-6293-7
Categories: Books > Science & Mathematics > Chemistry > Analytical chemistry > General
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN: 1-4613-6293-8
Barcode: 9781461362937

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