0
Your cart

Your cart is empty

Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials

Buy Now

Practical Scanning Electron Microscopy - Electron and Ion Microprobe Analysis (Paperback, Softcover reprint of the original 1st ed. 1975) Loot Price: R2,736
Discovery Miles 27 360
Practical Scanning Electron Microscopy - Electron and Ion Microprobe Analysis (Paperback, Softcover reprint of the original 1st...

Practical Scanning Electron Microscopy - Electron and Ion Microprobe Analysis (Paperback, Softcover reprint of the original 1st ed. 1975)

Joseph Goldstein

 (sign in to rate)
Loot Price R2,736 Discovery Miles 27 360 | Repayment Terms: R256 pm x 12*

Bookmark and Share

Expected to ship within 18 - 22 working days

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end."

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: October 2011
First published: 1975
Editors: Joseph Goldstein
Dimensions: 235 x 155 x 31mm (L x W x T)
Format: Paperback
Pages: 582
Edition: Softcover reprint of the original 1st ed. 1975
ISBN-13: 978-1-4613-4424-7
Categories: Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Promotions
LSN: 1-4613-4424-7
Barcode: 9781461344247

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

You might also like..

Sustainable Composites for Aerospace…
Mohammad Jawaid, Mohamed Thariq Paperback R5,181 R4,799 Discovery Miles 47 990
Non-Destructive Evaluation (NDE) of…
V. M. Karbhari Hardcover R5,583 Discovery Miles 55 830
Fatigue in Composites - Science and…
Bryan Harris Hardcover R6,336 Discovery Miles 63 360
Physical Testing of Textiles
B.P. Saville Hardcover R4,481 Discovery Miles 44 810
Ultra High Temperature Mechanical…
Hardcover R3,755 Discovery Miles 37 550
The Wear Debris Analysis Handbook
Trevor M. Hunt, Brian J. Roylance Hardcover R1,522 Discovery Miles 15 220
Dynamic Response of Advanced Ceramics
G Subhash Hardcover R4,543 Discovery Miles 45 430
Unsaturated Polyester Resins…
Sabu Thomas, Mahesh Hosur, … Paperback R5,562 Discovery Miles 55 620
Atlas of Material Damage
George Wypych Hardcover R5,910 Discovery Miles 59 100
Adverse Effects of Engineered…
Bengt Fadeel, Antonio Pietroiusti, … Hardcover R3,239 Discovery Miles 32 390
Materials Under Extreme Conditions…
A.K. Tyagi, S. Banerjee Hardcover R4,467 R4,158 Discovery Miles 41 580
Stress Corrosion Cracking - Theory and…
V. S. Raja, T. Shoji Paperback R6,569 R6,065 Discovery Miles 60 650

See more

Partners