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Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Reliability engineering
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Next Generation HALT and HASS - Robust Design of Electronics and Systems (Hardcover)
Loot Price: R2,404
Discovery Miles 24 040
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Next Generation HALT and HASS - Robust Design of Electronics and Systems (Hardcover)
Expected to ship within 12 - 19 working days
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Next Generation HALT and HASS presents a major paradigm shift from
reliability prediction-based methods to discovery of electronic
systems reliability risks. This is achieved by integrating highly
accelerated life test (HALT) and highly accelerated stress screen
(HASS) into a physics-of-failure-based robust product and process
development methodology. The new methodologies challenge misleading
and sometimes costly mis-application of probabilistic failure
prediction methods (FPM) and provide a new deterministic map for
reliability development. The authors clearly explain the new
approach with a logical progression of problem statement and
solutions. The book helps engineers employ HALT and HASS by
illustrating why the misleading assumptions used for FPM are
invalid. Next, the application of HALT and HASS empirical discovery
methods to quickly find unreliable elements in electronics systems
gives readers practical insight to the techniques. The physics of
HALT and HASS methodologies are highlighted, illustrating how they
uncover and isolate software failures due to hardware-software
interactions in digital systems. The use of empirical operational
stress limits for the development of future tools and reliability
discriminators is described. Key features: * Provides a clear basis
for moving from statistical reliability prediction models to
practical methods of insuring and improving reliability. *
Challenges existing failure prediction methodologies by
highlighting their limitations using real field data. * Explains a
practical approach to why and how HALT and HASS are applied to
electronics and electromechanical systems. * Presents opportunities
to develop reliability test discriminators for prognostics using
empirical stress limits. * Guides engineers and managers on the
benefits of the deterministic and more efficient methods of HALT
and HASS. * Integrates the empirical limit discovery methods of
HALT and HASS into a physics of failure based robust product and
process development process.
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