Based on the Fourth Symposium on Particles on Surfaces held
recently during the Annual Meeting of the Fine Particle Society in
Las Vegas, Nevada, this useful reference presents the latest
techniques for the detection, identification, analysis,
characterization, and removal of particles found on a wide variety
of surfaces. Covering the fundamental aspects of the discipline as
well as the most recent developments and exploring a host of
procedures, including light scattering, spectroscopic, x-ray
fluorescence, sonication, spray impingement, liquid jets,
fluorocarbon surfactant solutions, and laser cleaning, Particles on
Surfaces examines adhesion induced particle deformation ... the use
of atomic force microscopy in probing particle-particle adhesion
... particle contamination in the fields of microelectronics
aerospace, and optical surfaces ... the role of air ionization in
reducing surface contamination by particles in the cleanroom ...
abrasive blasting media for a contamination-free deburring process
... particle generation and control in tubing and piping connection
design ... focused acoustic waves for the investigation of particle
behavior ... and much more. With over 900 literature citations,
tables, photographs, drawings, and equations, Particles on Surfaces
is an excellent resource for physical, surface, colloid, polymer
and adhesion chemists; chemical and assembly engineers; material
scientists; semiconductor, microelectronics, and head and disc
manufacturers; cleanroom designers; contamination control
technologists in the aerospace, automotive, optics, biomedical, and
pharmaceutical industries; and upper-level undergraduate and
graduate students in these disciplines.
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