Ellipsometry of Functional Organic Surfaces and Films (Paperback, Softcover reprint of the original 1st ed. 2014)

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Series in Surface Sciences, 52
Release date:	August 2016
First published:	2014
Editors:	Karsten Hinrichs • Klaus Jochen Eichhorn
Dimensions:	235 x 155 x 20mm (L x W x T)
Format:	Paperback
Pages:	363
Edition:	Softcover reprint of the original 1st ed. 2014
ISBN-13:	978-3-662-51020-9
Categories:	Books > Science & Mathematics > Physics > Optics (light) Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids) Books > Science & Mathematics > Chemistry > Physical chemistry > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN:	3-662-51020-0
Barcode:	9783662510209

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