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Artificial Neural Networks in Pattern Recognition - Third IAPR TC3 Workshop, ANNPR 2008 Paris, France, July 2-4, 2008, Proceedings (Paperback, 2008 ed.)
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Artificial Neural Networks in Pattern Recognition - Third IAPR TC3 Workshop, ANNPR 2008 Paris, France, July 2-4, 2008, Proceedings (Paperback, 2008 ed.)
Series: Lecture Notes in Computer Science, 5064
Expected to ship within 10 - 15 working days
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TheThirdIAPRTC3WorkshoponArti?cialNeuralNetworksinPatternRec-
nition, ANNPR 2008, was held at Pierre and Marie Curie University
in Paris (France), July 2-4, 2008. The workshop was organized by
the Technical C- mittee on Neural Networks and Computational
Intelligence (TC3) that is one of the 20 TCs of the International
Association for Pattern Recognition (IAPR). The scope of TC3
includes computational intelligence approaches, such as fuzzy
systems, evolutionary computing and arti?cial neural networks and
their use in various pattern recognition applications. ANNPR 2008
followed the success of the previous workshops: ANNPR 2003 held at
the University of Florence (Italy) andANPPR 2006held at
ReisensburgCastle, Universityof Ulm (Germany).All the workshops
featured a single-track program including both oral sessions and
posters with a focus on active participation from every
participant. Inrecentyears, the?eld
ofneuralnetworkshasmaturedconsiderablyinboth
methodologyandreal-worldapplications.Asre?ectedinthisbook,
arti?cialn- ral networks in pattern recognition combine many ideas
from machine learning, advanced statistics, signal and image
processing for solving complex real-world pattern recognition
problems. High quality across such a diverse ?eld of research can
only be achieved through a rigorous and selective review process.
For this workshop, 57 papers were submitted out of which 29 were
selected for inclusion in the proceedings. The oral sessions
included 18 papers, while 11 contributions were presented as
posters. ANNPR 2008 featured research works in the areas of
supervised and unsupervised learning, multiple classi?er systems,
pattern recognition in signal and image processing, and feature
selectio
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