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III-Nitride Semiconductors - Electrical, Structural and Defects Properties (Hardcover)
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III-Nitride Semiconductors - Electrical, Structural and Defects Properties (Hardcover)
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Research advances in III-nitride semiconductor materials and device
have led to an exponential increase in activity directed towards
electronic and optoelectronic applications. There is also great
scientific interest in this class of materials because they appear
to form the first semiconductor system in which extended defects do
not severely affect the optical properties of devices. The volume
consists of chapters written by a number of leading researchers in
nitride materials and device technology with the emphasis on the
dopants incorporations, impurities identifications, defects
engineering, defects characterization, ion implantation,
irradiation-induced defects, residual stress, structural defects
and phonon confinement. This unique volume provides a comprehensive
review and introduction of defects and structural properties of GaN
and related compounds for newcomers to the field and stimulus to
further advances for experienced researchers. Given the current
level of interest and research activity directed towards nitride
materials and devices, the publication of the volume is
particularly timely. Early pioneering work by Pankove and
co-workers in the 1970s yielded a metal-insulator-semiconductor GaN
light-emitting diode (LED), but the difficulty of producing p-type
GaN precluded much further effort. The current level of activity in
nitride semiconductors was inspired largely by the results of
Akasaki and co-workers and of Nakamura and co-workers in the late
1980s and early 1990s in the development of p-type doping in GaN
and the demonstration of nitride-based LEDs at visible wavelengths.
These advances were followed by the successful fabrication and
commercialization of nitride blue laser diodes by Nakamura et al at
Nichia. The chapters contained in this volume constitutes a mere
sampling of the broad range of research on nitride semiconductor
materials and defect issues currently being pursued in academic,
government, and industrial laboratories worldwide.
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