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Advances in Imaging and Electron Physics, Volume 223 (Hardcover) Loot Price: R5,230
Discovery Miles 52 300
Repayment Terms: R490 pm x 12*
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Advances in Imaging and Electron Physics, Volume 223 (Hardcover): Martin Hytch, Peter W. Hawkes

Advances in Imaging and Electron Physics, Volume 223 (Hardcover)

Martin Hytch, Peter W. Hawkes

Series: Advances in Imaging and Electron Physics

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Loot Price R5,230 Discovery Miles 52 300 | Repayment Terms: R490 pm x 12*

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Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

General

Imprint: Academic Press Inc
Country of origin: United Kingdom
Series: Advances in Imaging and Electron Physics
Release date: August 2022
First published: 2022
Editors: Martin Hytch • Peter W. Hawkes
Dimensions: 229 x 152mm (L x W)
Format: Hardcover
Pages: 266
ISBN-13: 978-0-323-98863-6
Categories: Books > Computing & IT > Applications of computing > Signal processing
Books > Professional & Technical > Mechanical engineering & materials > Mechanical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
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LSN: 0-323-98863-6
Barcode: 9780323988636

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