Quantitative Atomic-Resolution Electron Microscopy, Volume 217 (Hardcover)

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	April 2021
First published:	2021
Series editors:	Martin Hytch • Peter W. Hawkes
Dimensions:	229 x 152mm (L x W)
Format:	Hardcover
Pages:	294
ISBN-13:	978-0-12-824607-8
Categories:	Books > Computing & IT > Applications of computing > Signal processing Books > Professional & Technical > Mechanical engineering & materials > Mechanical engineering > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General Promotions
LSN:	0-12-824607-3
Barcode:	9780128246078

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