The study of semiconductor-layer structures using infrared
ellipsometry is a rapidly growing field within optical
spectroscopy. This book offers basic insights into the concepts of
phonons, plasmons and polaritons, and the infrared dielectric
function of semiconductors in layered structures. It describes how
strain, composition, and the state of the atomic order within
complex layer structures of multinary alloys can be determined from
an infrared ellipsometry examination. Special emphasis is given to
free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including
multinary alloys of zincblende and wurtzite structure semiconductor
materials, and future applications such as organic layer structures
and highly correlated electron systems are proposed.
General
Imprint: |
Springer-Verlag
|
Country of origin: |
Germany |
Series: |
Springer Tracts in Modern Physics, 209 |
Release date: |
November 2004 |
First published: |
2004 |
Authors: |
Mathias Schubert
|
Dimensions: |
232 x 155 x 12mm (L x W x T) |
Format: |
Hardcover
|
Pages: |
196 |
Edition: |
2004 ed. |
ISBN-13: |
978-3-540-23249-0 |
Categories: |
Books >
Science & Mathematics >
Physics >
Optics (light)
|
LSN: |
3-540-23249-4 |
Barcode: |
9783540232490 |
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