|
Books > Computing & IT > General theory of computing
|
Buy Now
On-Line Testing for VLSI (Hardcover, Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998)
Loot Price: R3,020
Discovery Miles 30 200
|
|
|
On-Line Testing for VLSI (Hardcover, Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998)
Series: Frontiers in Electronic Testing, 11
Expected to ship within 10 - 15 working days
|
Test functions (fault detection, diagnosis, error correction,
repair, etc.) that are applied concurrently while the system
continues its intended function are defined as on-line testing. In
its expanded scope, on-line testing includes the design of
concurrent error checking subsystems that can be themselves
self-checking, fail-safe systems that continue to function
correctly even after an error occurs, reliability monitoring, and
self-test and fault-tolerant designs. On-Line Testing for VLSI
contains a selected set of articles that discuss many of the modern
aspects of on-line testing as faced today. The contributions are
largely derived from recent IEEE International On-Line Testing
Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and
Dhiraj Pradhan organized the articles into six chapters. In the
first chapter the editors introduce a large number of approaches
with an expanded bibliography in which some references date back to
the sixties. On-Line Testing for VLSI is an edited volume of
original research comprising invited contributions by leading
researchers.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
|
You might also like..
|
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
(1)
