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Books > Computing & IT > General theory of computing
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On-Line Testing for VLSI (Hardcover, Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998)
Loot Price: R2,935
Discovery Miles 29 350
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On-Line Testing for VLSI (Hardcover, Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998)
Series: Frontiers in Electronic Testing, 11
Expected to ship within 10 - 15 working days
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Test functions (fault detection, diagnosis, error correction,
repair, etc.) that are applied concurrently while the system
continues its intended function are defined as on-line testing. In
its expanded scope, on-line testing includes the design of
concurrent error checking subsystems that can be themselves
self-checking, fail-safe systems that continue to function
correctly even after an error occurs, reliability monitoring, and
self-test and fault-tolerant designs. On-Line Testing for VLSI
contains a selected set of articles that discuss many of the modern
aspects of on-line testing as faced today. The contributions are
largely derived from recent IEEE International On-Line Testing
Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and
Dhiraj Pradhan organized the articles into six chapters. In the
first chapter the editors introduce a large number of approaches
with an expanded bibliography in which some references date back to
the sixties. On-Line Testing for VLSI is an edited volume of
original research comprising invited contributions by leading
researchers.
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