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Books > Professional & Technical > Technology: general issues > Nanotechnology

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Emerging Nanotechnologies - Test, Defect Tolerance, and Reliability (Hardcover, 2008 ed.) Loot Price: R4,416
Discovery Miles 44 160
Emerging Nanotechnologies - Test, Defect Tolerance, and Reliability (Hardcover, 2008 ed.): Mohammad Tehranipoor

Emerging Nanotechnologies - Test, Defect Tolerance, and Reliability (Hardcover, 2008 ed.)

Mohammad Tehranipoor

Series: Frontiers in Electronic Testing, 37

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Loot Price R4,416 Discovery Miles 44 160 | Repayment Terms: R414 pm x 12*

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Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Frontiers in Electronic Testing, 37
Release date: December 2007
First published: 2008
Editors: Mohammad Tehranipoor
Dimensions: 235 x 155 x 23mm (L x W x T)
Format: Hardcover
Pages: 408
Edition: 2008 ed.
ISBN-13: 978-0-387-74746-0
Categories: Books > Professional & Technical > Technology: general issues > Nanotechnology
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LSN: 0-387-74746-X
Barcode: 9780387747460

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