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Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials
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Not currently available
X-Ray Diffraction for Materials Research - From Fundamentals to Applications (Hardcover)
Loot Price: R3,573
Discovery Miles 35 730
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X-Ray Diffraction for Materials Research - From Fundamentals to Applications (Hardcover)
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X-ray diffraction is a useful and powerful analysis technique for
characterizing crystalline materials commonly employed in MSE,
physics, and chemistry. This informative new book describes the
principles of X-ray diffraction and its applications to materials
characterization. It consists of three parts. The first deals with
elementary crystallography and optics, which is essential for
understanding the theory of X-ray diffraction discussed in the
second section of the book. Part 2 describes how the X-ray
diffraction can be applied for characterizing such various forms of
materials as thin films, single crystals, and powders. The third
section of the book covers applications of X-ray diffraction. The
book presents a number of examples to help readers better
comprehend the subject. X-Ray Diffraction for Materials Research:
From Fundamentals to Applications also * provides background
knowledge of diffraction to enable nonspecialists to become
familiar with the topics * covers the practical applications as
well as the underlying principle of X-ray diffraction * presents
appropriate examples with answers to help readers understand the
contents more easily * includes thin film characterization by X-ray
diffraction with relevant experimental techniques * presents a huge
number of elaborately drawn graphics to help illustrate the content
The book will help readers (students and researchers in materials
science, physics, and chemistry) understand crystallography and
crystal structures, interference and diffraction, structural
analysis of bulk materials, characterization of thin films, and
nondestructive measurement of internal stress and phase transition.
Diffraction is an optical phenomenon and thus can be better
understood when it is explained with an optical approach, which has
been neglected in other books. This book helps to fill that gap,
providing information to convey the concept of X-ray diffraction
and how it can be applied to the materials analysis. This book will
be a valuable reference book for researchers in the field and will
work well as a good introductory book of X-ray diffraction for
students in materials science, physics, and chemistry.
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