Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis (Hardcover)

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

General

Imprint:	Imperial College Press
Country of origin:	United Kingdom
Release date:	October 2014
First published:	June 2014
Authors:	Nobuo Tanaka
Dimensions:	238 x 161 x 31mm (L x W x T)
Format:	Hardcover
Pages:	616
ISBN-13:	978-1-84816-789-6
Categories:	Books > Science & Mathematics > Physics > Optics (light)
LSN:	1-84816-789-X
Barcode:	9781848167896

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