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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > Laser technology

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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices (Paperback, 2013 ed.) Loot Price: R9,829
Discovery Miles 98 290
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices (Paperback, 2013 ed.): Osamu Ueda, Stephen J....

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices (Paperback, 2013 ed.)

Osamu Ueda, Stephen J. Pearton

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Loot Price R9,829 Discovery Miles 98 290 | Repayment Terms: R921 pm x 12*

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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: October 2014
First published: 2013
Editors: Osamu Ueda • Stephen J. Pearton
Dimensions: 235 x 155 x 33mm (L x W x T)
Format: Paperback
Pages: 616
Edition: 2013 ed.
ISBN-13: 978-1-4939-0119-7
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > Laser technology
LSN: 1-4939-0119-2
Barcode: 9781493901197

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