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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics

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Blind Image Deconvolution - Theory and Applications (Hardcover) Loot Price: R6,022
Discovery Miles 60 220
Blind Image Deconvolution - Theory and Applications (Hardcover): Patrizio Campisi, Karen Egiazarian

Blind Image Deconvolution - Theory and Applications (Hardcover)

Patrizio Campisi, Karen Egiazarian; Contributions by Aggelos K. Katsaggelos, Dimitrios Hatzinakos, Aristidis Likas, Rafael Molina, Filip Sroubek, Jan Flusser, Alessandro Neri, Tom E. Bishop

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Loot Price R6,022 Discovery Miles 60 220 | Repayment Terms: R564 pm x 12*

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Blind image deconvolution is constantly receiving increasing attention from the academic as well the industrial world due to both its theoretical and practical implications. The field of blind image deconvolution has several applications in different areas such as image restoration, microscopy, medical imaging, biological imaging, remote sensing, astronomy, nondestructive testing, geophysical prospecting, and many others. Blind Image Deconvolution: Theory and Applications surveys the current state of research and practice as presented by the most recognized experts in the field, thus filling a gap in the available literature on blind image deconvolution. Explore the gamut of blind image deconvolution approaches and algorithms that currently exist and follow the current research trends into the future. This comprehensive treatise discusses Bayesian techniques, single- and multi-channel methods, adaptive and multi-frame techniques, and a host of applications to multimedia processing, astronomy, remote sensing imagery, and medical and biological imaging at the whole-body, small-part, and cellular levels. Everything you need to step into this dynamic field is at your fingertips in this unique, self-contained masterwork. For image enhancement and restoration without a priori information, turn to Blind Image Deconvolution: Theory and Applications for the knowledge and techniques you need to tackle real-world problems.

General

Imprint: Crc Press
Country of origin: United States
Release date: May 2007
First published: May 2007
Editors: Patrizio Campisi • Karen Egiazarian
Contributors: Aggelos K. Katsaggelos • Dimitrios Hatzinakos • Aristidis Likas • Rafael Molina • Filip Sroubek • Jan Flusser • Alessandro Neri • Tom E. Bishop
Dimensions: 234 x 156 x 31mm (L x W x T)
Format: Hardcover
Pages: 472
ISBN-13: 978-0-8493-7367-1
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
LSN: 0-8493-7367-0
Barcode: 9780849373671

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