Advances in Imaging and Electron Physics, Volume 225 (Hardcover)

Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	April 2023
First published:	2023
Editors:	Peter W. Hawkes • Martin Hytch
Dimensions:	229 x 152mm (L x W)
Format:	Hardcover
Pages:	232
ISBN-13:	978-0-443-19326-2
Categories:	Books > Computing & IT > Applications of computing > Signal processing Books > Professional & Technical > Mechanical engineering & materials > Mechanical engineering > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
LSN:	0-443-19326-6
Barcode:	9780443193262

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