Advances in Imaging and Electron Physics merges two long-running
serials-Advances in Electronics and Electron Physics and Advances
in Optical and Electron Microscopy. This series features extended
articles on the physics of electron devices (especially
semiconductor devices), particle optics at high and low energies,
microlithography, image science and digital image processing,
electromagnetic wave propagation, electron microscopy, and the
computing methods used in all these domains.
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