This work provides a comprehensive discussion of the bias
dependence of equivalent circuit parameters for the three devices
and an extensive discussion of temperature dependence. It: covers
recess-etched MESFETs and self-aligned MESFETs with and without
lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP
lattice-matched HEMT equivalent circuits; and describes a
large-signal, temperature-dependent model extractor for A1GaAs-GaAs
HBTs. The book is intended for circuit designers, process and
device developers and test engineers.
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