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Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs (Hardcover) Loot Price: R4,340
Discovery Miles 43 400
Repayment Terms: R407 pm x 12*
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Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs (Hardcover): Robert Anholt

Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs (Hardcover)

Robert Anholt

Series: Microwave Library

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Loot Price R4,340 Discovery Miles 43 400 | Repayment Terms: R407 pm x 12*

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This work provides a comprehensive discussion of the bias dependence of equivalent circuit parameters for the three devices and an extensive discussion of temperature dependence. It: covers recess-etched MESFETs and self-aligned MESFETs with and without lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP lattice-matched HEMT equivalent circuits; and describes a large-signal, temperature-dependent model extractor for A1GaAs-GaAs HBTs. The book is intended for circuit designers, process and device developers and test engineers.

General

Imprint: Artech House Publishers
Country of origin: United States
Series: Microwave Library
Release date: November 1994
First published: November 1994
Authors: Robert Anholt
Dimensions: 229 x 152 x 22mm (L x W x T)
Format: Hardcover - Laminated cover
Pages: 324
ISBN-13: 978-0-89006-749-9
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
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LSN: 0-89006-749-X
Barcode: 9780890067499

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