Ion Time-of-Flight Spectrometer (Paperback)

Ion time-of-flight spectrometry techniques are investigated for potential application to neutron depth profiling. Time-of-flight techniques are used extensively in a wide range of scientific and technological applications including energy and mass spectroscopy. Ion time-of-flight spectrometry offers highly precise measurement capabilities, particularly for slow particles. Time-of-flight spectrometry involves correlated detection of two signals by a coincidence unit. In ion time-of-flight spectroscopy, the ion generates the primary input signal. The secondary signal can be obtained by a number of ways. In this work, the secondary signal is created by the passage of the primary ion through a thin carbon foil. Two ion time-of-flight spectrometer design paradigms are introduced: the parallel electric and magnetic (PEM) field spectrometer and the cross electric and magnetic (CEM) field spectrometer.

General

Imprint:	VDM Verlag
Country of origin:	Germany
Release date:	December 2008
First published:	December 2008
Authors:	Sacit M. Cetiner
Dimensions:	229 x 152 x 12mm (L x W x T)
Format:	Paperback - Trade
Pages:	216
ISBN-13:	978-3-639-09980-5
Categories:	Books > Professional & Technical > Energy technology & engineering > Nuclear power & engineering
LSN:	3-639-09980-X
Barcode:	9783639099805

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