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Soft Error Mechanisms, Modeling and Mitigation (Paperback, Softcover reprint of the original 1st ed. 2016)
Loot Price: R1,506
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Soft Error Mechanisms, Modeling and Mitigation (Paperback, Softcover reprint of the original 1st ed. 2016)
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This book introduces readers to various radiation soft-error
mechanisms such as soft delays, radiation induced clock jitter and
pulses, and single event (SE) coupling induced effects. In addition
to discussing various radiation hardening techniques for
combinational logic, the author also describes new mitigation
strategies targeting commercial designs. Coverage includes novel
soft error mitigation techniques such as the Dynamic Threshold
Technique and Soft Error Filtering based on Transmission gate with
varied gate and body bias. The discussion also includes modeling of
SE crosstalk noise, delay and speed-up effects. Various mitigation
strategies to eliminate SE coupling effects are also introduced.
Coverage also includes the reliability of low power
energy-efficient designs and the impact of leakage power
consumption optimizations on soft error robustness. The author
presents an analysis of various power optimization techniques,
enabling readers to make design choices that reduce static power
consumption and improve soft error reliability at the same time.
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