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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics

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Industrial X-Ray Computed Tomography (Hardcover, 1st ed. 2018) Loot Price: R4,833
Discovery Miles 48 330
Industrial X-Ray Computed Tomography (Hardcover, 1st ed. 2018): Simone Carmignato, Wim Dewulf, Richard Leach

Industrial X-Ray Computed Tomography (Hardcover, 1st ed. 2018)

Simone Carmignato, Wim Dewulf, Richard Leach

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Loot Price R4,833 Discovery Miles 48 330 | Repayment Terms: R453 pm x 12*

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X-ray computed tomography has been used for several decades as a tool for measuring the three-dimensional geometry of the internal organs in medicine. However, in recent years, we have seen a move in manufacturing industries for the use of X-ray computed tomography; first to give qualitative information about the internal geometry and defects in a component, and more recently, as a fully-quantitative technique for dimensional and materials analysis. This trend is primarily due to the ability of X-ray computed tomography to give a high-density and multi-scale representation of both the external and internal geometry of a component, in a non-destructive, non-contact and relatively fast way. But, due to the complexity of X-ray computed tomography, there are remaining metrological issues to solve and the specification standards are still under development. This book will act as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. It presents the fundamental principles of the technique, detailed descriptions of the various components (hardware and software), current developments in calibration and performance verification and a wealth of example applications. The book will also highlight where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0.

General

Imprint: Springer International Publishing AG
Country of origin: Switzerland
Release date: October 2017
First published: 2017
Editors: Simone Carmignato • Wim Dewulf • Richard Leach
Dimensions: 235 x 155 x 27mm (L x W x T)
Format: Hardcover
Pages: 369
Edition: 1st ed. 2018
ISBN-13: 978-3-319-59571-9
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
LSN: 3-319-59571-7
Barcode: 9783319595719

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