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Books > Professional & Technical > Technology: general issues > Nanotechnology

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Fundamentals of Nanoscale Film Analysis (Hardcover, 2007 ed.) Loot Price: R2,827

Discovery Miles 28 270

Repayment Terms: R265 pm x 12*

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Fundamentals of Nanoscale Film Analysis (Hardcover, 2007 ed.): Terry L. Alford, L.C. Feldman, James W. Mayer

Fundamentals of Nanoscale Film Analysis (Hardcover, 2007 ed.)

Terry L. Alford, L.C. Feldman, James W. Mayer

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Loot Price R2,827 Discovery Miles 28 270 | Repayment Terms: R265 pm x 12*

Expected to ship within 12 - 17 working days

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From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	February 2007
First published:	2007
Authors:	Terry L. Alford • L.C. Feldman • James W. Mayer
Dimensions:	235 x 156 x 27mm (L x W x T)
Format:	Hardcover
Pages:	336
Edition:	2007 ed.
ISBN-13:	978-0-387-29260-1
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Science & Mathematics > Chemistry > Analytical chemistry > General Books > Science & Mathematics > Chemistry > Physical chemistry > Surface chemistry & adsorption Promotions
LSN:	0-387-29260-8
Barcode:	9780387292601