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Mathematical & Physical Aspects of Experimental Investigations on Electron & Relaxation Time Spectra in Bulk & Nano-Structured Semiconductors & Insulators (Hardcover)
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Mathematical & Physical Aspects of Experimental Investigations on Electron & Relaxation Time Spectra in Bulk & Nano-Structured Semiconductors & Insulators (Hardcover)
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This book summarises important outcomes of a quarter century of
developments in advanced mathematical approaches and their
implementations for deconvolution. The analysis of electron and
relaxation time spectra obtained from the results of appropriate
physical experiments fulfilled on real samples of bulk
amorphous/crystalline semiconductors and insulators as well as on
nano-structured materials and devices are also discussed. The
second chapter of this book depicts key features of many well-known
traditional and some modern techniques for experimental
investigations of electron density and time relaxation spectra in
such semiconductors and insulators. as Additionally, there is an
emphasis on archetypal problems related to the analysis and
interpretation of the results of those experimental techniques.
Some generic (though crucially important in the context of this
book) physical and mathematical aspects of the polarisation and
relaxation processes in solids, well-known one-dimensional direct
and inverse integral transforms, linear integral equations of the
first and second kinds, ill-posed mathematical problems and
specific mathematical approaches to solution(s) of those are
discussed in the third, fourth and fifth chapters, respectively. A
majority of the aforementioned mathematical approaches are
essentially based on the so-called regularisation concept,
pioneered by famous Russian mathematicians (A N Tikhonov, M M
Lavrentiev, V K Ivanov, V Ya Arsenin and their co-workers) in the
second half of the twentieth century. Mathematical aspects of the
regularisation concept are discussed (to some extent) in the fifth
chapter of the book in comparison to the similar aspects of the
traditional modelling approach with multiple references on
appropriate original articles and books. Thanks to distinctive
features of the regularisation concept, it endures a protracted
history (which nowadays well exceeds 5 decades), becomes the
dominant strategy for the solution of various inverse problems, and
is widely used in many types of modern applications and
computational packages. In particular, the regularisation
algorithms are incorporated into Mathematica, Matlab, Python and
Octave packages. This generic regularisation concept had been
successfully implemented by the author of this book during the
development and practical realisation (programming) of several
essentially different regularisation algorithms (described in
detail in the sixth chapter of the book) for unambiguous
investigations and the analysis of results of appropriated physical
experiments, fulfilled over a period from 1984 to 2009, both in
Russia and in Singapore. Furthermore, actual results of such
experimental investigations are discussed in the seventh chapter
following closely appropriate original publications, and in
comparison with their counterparts obtained by traditional (eg:
modelling) approaches. As it is also demonstrated in the seventh
chapter with the relevant examples and detailed discussion(s), the
implementation of the aforementioned regularisation algorithms
allows one to identify (and interpret thereafter) new important
features of the intra-gap and near-band-gap electronic spectra of
the amorphous and polycrystalline semiconductors and insulators.
The relaxation time spectra of those materials, which are usually
unattainable via the implementation of the modelling approach is
also analysed. It is important that the regularisation concept
(mathematically related to its alternative ones, e.g., the direct
and inverse Radon integral transforms) has many other, very
important implementations, e.g., in medical computerised
tomography, security-related applications, archaeology, geophysics,
etc. Similar to the abovementioned spectroscopic techniques, the
X-ray-based computerised tomography eventually yields vital
information on features of electron density distribution in a
studied object, though the desired function in the latter case
rather depends on spatial variables than on energetic ones. The
mathematical essence of the Radon-transform-based computerised
tomography is also summarised very briefly in one of the sections
of this book. A comprehensive reference list of this book comprises
many other key references (for those who are interested in the
aforementioned topics discussed herein).
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