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Test Resource Partitioning for System-on-a-Chip (Hardcover, 2002 ed.) Loot Price: R3,014
Discovery Miles 30 140
Test Resource Partitioning for System-on-a-Chip (Hardcover, 2002 ed.): Vikram Iyengar, Anshuman Chandra

Test Resource Partitioning for System-on-a-Chip (Hardcover, 2002 ed.)

Vikram Iyengar, Anshuman Chandra

Series: Frontiers in Electronic Testing, 20

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Loot Price R3,014 Discovery Miles 30 140 | Repayment Terms: R282 pm x 12*

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Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic.

SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols.

Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume.

Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Frontiers in Electronic Testing, 20
Release date: June 2002
First published: 2002
Authors: Vikram Iyengar • Anshuman Chandra
Dimensions: 235 x 155 x 15mm (L x W x T)
Format: Hardcover
Pages: 232
Edition: 2002 ed.
ISBN-13: 978-1-4020-7119-5
Categories: Books > Computing & IT > General theory of computing > General
Books > Computing & IT > Applications of computing > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
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LSN: 1-4020-7119-1
Barcode: 9781402071195

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