Test Resource Partitioning for System-on-a-Chip is about test
resource partitioning and optimization techniques for plug-and-play
system-on-a-chip (SOC) test automation. Plug-and-play refers to the
paradigm in which core-to-core interfaces as well as core-to-SOC
logic interfaces are standardized, such that cores can be easily
plugged into "virtual sockets" on the SOC design, and core tests
can be plugged into the SOC during test without substantial effort
on the part of the system integrator. The goal of the book is to
position test resource partitioning in the context of SOC test
automation, as well as to generate interest and motivate research
on this important topic.
SOC integrated circuits composed of embedded cores are now
commonplace. Nevertheless, There remain several roadblocks to rapid
and efficient system integration. Test development is seen as a
major bottleneck in SOC design, and test challenges are a major
contributor to the widening gap between design capability and
manufacturing capacity. Testing SOCs is especially challenging in
the absence of standardized test structures, test automation tools,
and test protocols.
Test Resource Partitioning for System-on-a-Chip responds to a
pressing need for a structured methodology for SOC test automation.
It presents new techniques for the partitioning and optimization of
the three major SOC test resources: test hardware, testing time and
test data volume.
Test Resource Partitioning for System-on-a-Chip paves the way
for a powerful integrated framework to automate the test flow for a
large number of cores in an SOC in a plug-and-play fashion. The
framework presented allows the system integrator to reduce test
cost and meet short time-to-market requirements.
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