Characterization of C-V curves and Analysis, Using VEE Pro Software (Paperback)

The most commonly used tool for studying gate-oxide quality in detail is the Capacitance-Voltage (iV) technique. iV test results offer a wealth of device and process Information, including bulk and interface charges and many MOS-device parameters.This Project will devote for how to use the Agilent LCR meter (E-4980A) to make iV measurements. It also addresses basic MOS physics, proper iV measurement techniques, and parameter extraction from iV test results. iV measurements are typically made on a capacitor- like device, such as a MOS capacitor (MOS-e. Successful measurements require compensating for stray capacitance, recording capacitance values only at equilibrium conditions, and applying measuring signals in an appropriate sequence. These issues are addressed in my project under result chapter to provide guidance for choosing and/or writing test routines and preparing for iV tests. This work has Introduction (Chapter-1), VEE-Pro Software (Chapter-2), SUPREM Simulation (Chapter-3), Fabrication of MOS(Oxidation) (Chapter-5), Capacitances of MOS (Chapter-6), Record the data of iV curves (Chapter-7) and Conclusion (Chapter-8).

General

Imprint:	VDM Verlag
Country of origin:	Germany
Release date:	July 2010
First published:	July 2010
Authors:	Viranjay M. Srivastava
Dimensions:	229 x 152 x 5mm (L x W x T)
Format:	Paperback - Trade
Pages:	84
ISBN-13:	978-3-639-26155-4
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > General
LSN:	3-639-26155-0
Barcode:	9783639261554

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