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Modeling and Analysis of Transient Processes in Open Resonant Structures - New Methods and Techniques (Hardcover, 2007 ed.) Loot Price: R4,280
Discovery Miles 42 800
Repayment Terms: R401 pm x 12*
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Modeling and Analysis of Transient Processes in Open Resonant Structures - New Methods and Techniques (Hardcover, 2007 ed.):...

Modeling and Analysis of Transient Processes in Open Resonant Structures - New Methods and Techniques (Hardcover, 2007 ed.)

Yuriy K. Sirenko, Staffan Stroem, Nataliya P. Yashina

Series: Springer Series in Optical Sciences, 122

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Loot Price R4,280 Discovery Miles 42 800 | Repayment Terms: R401 pm x 12*

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This book describes a systematic approach to scattering of transient fields which can be introduced in undergraduate or graduate courses. The initial boundary value problems considered describe the transient electromagnetic fields formed by open periodic, compact, and waveguide resonators. The methods developed and the mathematical and physical results obtained provide a basis on which a modern theory for the scattering of resonant non-harmonic waves can be developed.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Springer Series in Optical Sciences, 122
Release date: 2000
First published: 2007
Authors: Yuriy K. Sirenko • Staffan Stroem • Nataliya P. Yashina
Dimensions: 235 x 155 x 20mm (L x W x T)
Format: Hardcover
Pages: 353
Edition: 2007 ed.
ISBN-13: 978-0-387-30878-4
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
LSN: 0-387-30878-4
Barcode: 9780387308784

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