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Atomic Force Microscopy (Hardcover, 2nd ed. 2019): Bert Voigtlander Atomic Force Microscopy (Hardcover, 2nd ed. 2019)
Bert Voigtlander
R3,954 Discovery Miles 39 540 Ships in 12 - 17 working days

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Atomic Force Microscopy (Paperback, 2nd ed. 2019): Bert Voigtlander Atomic Force Microscopy (Paperback, 2nd ed. 2019)
Bert Voigtlander
R4,244 Discovery Miles 42 440 Ships in 10 - 15 working days

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Scanning Probe Microscopy - Atomic Force Microscopy and Scanning Tunneling Microscopy (Hardcover, 2015 ed.): Bert Voigtlander Scanning Probe Microscopy - Atomic Force Microscopy and Scanning Tunneling Microscopy (Hardcover, 2015 ed.)
Bert Voigtlander
R4,421 Discovery Miles 44 210 Ships in 12 - 17 working days

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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