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Atomic Force Microscopy (Hardcover, 2nd ed. 2019) Loot Price: R4,251
Discovery Miles 42 510
Atomic Force Microscopy (Hardcover, 2nd ed. 2019): Bert Voigtlander

Atomic Force Microscopy (Hardcover, 2nd ed. 2019)

Bert Voigtlander

Series: NanoScience and Technology

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Loot Price R4,251 Discovery Miles 42 510 | Repayment Terms: R398 pm x 12*

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This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

General

Imprint: Springer Nature Switzerland AG
Country of origin: Switzerland
Series: NanoScience and Technology
Release date: June 2019
First published: 2019
Authors: Bert Voigtlander
Dimensions: 235 x 155mm (L x W)
Format: Hardcover
Pages: 331
Edition: 2nd ed. 2019
ISBN-13: 978-3-03-013653-6
Categories: Books > Science & Mathematics > Biology, life sciences > General
Books > Professional & Technical > Technology: general issues > Nanotechnology
Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Other manufacturing technologies > Precision instruments manufacture > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
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LSN: 3-03-013653-1
Barcode: 9783030136536

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