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Pattern Recognition in Bioinformatics - 6th IAPR International Conference, PRIB 2011, Delft, The Netherlands, November 2-4,... Pattern Recognition in Bioinformatics - 6th IAPR International Conference, PRIB 2011, Delft, The Netherlands, November 2-4, 2011, Proceedings (Paperback, 2011 ed.)
Marco Loog, Lodewyk Wessels, Marcel J.T. Reinders, Dick De Ridder
R1,424 Discovery Miles 14 240 Ships in 18 - 22 working days

This book constitutes the refereed proceedings of the 6th International Conference on Pattern Recognition in Bioinformatics, PRIB 2011, held in Delft, The Netherlands, in November 2011. The 29 revised full papers presented were carefully reviewed and selected from 35 submissions. The papers cover the wide range of possible applications of bioinformatics in pattern recognition: novel algorithms to handle traditional pattern recognition problems such as (bi)clustering, classification and feature selection; applications of (novel) pattern recognition techniques to infer and analyze biological networks and studies on specific problems such as biological image analysis and the relation between sequence and structure. They are organized in the following topical sections: clustering, biomarker selection and classification, network inference and analysis, image analysis, and sequence, structure, and interactions.

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong... Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings (Paperback, 2006 ed.)
Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick De Ridder
R2,830 Discovery Miles 28 300 Ships in 18 - 22 working days

This book constitutes the refereed proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held jointly in Hong Kong, China in August 2006 as a satellite event of the 18th International Conference of Pattern Recognition, ICPR 2006.

The 38 revised full papers and 61 revised poster papers presented together with 4 invited papers were carefully reviewed and selected from 217 submissions. The papers are organized in topical sections on image analysis, vision, character recognition, bayesian networks, graph-based methods, similarity and feature extraction, image and video, vision, kernel-based methods, recognition and classification, similarity and feature extraction, document analysis, graph-based methods, recognition and classification, image analysis, facial image analysis, representation, feature selection, clustering, multiple classifier systems, recognition and classification, unsupervised learning, dimensionality, representation, biometrics, and applications.

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2004 and SPR 2004,... Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2004 and SPR 2004, Lisbon, Portugal, August 18-20, 2004 Proceedings (Paperback, 2004 ed.)
Ana Fred, Terry Caelli, Robert P.W. Duin, Aurelio Campilho, Dick De Ridder
R4,248 Discovery Miles 42 480 Ships in 18 - 22 working days

This volume contains all papers presented at SSPR 2004 and SPR 2004, hosted by the Instituto de Telecomunicac" ,oes/Instituto Superior T' ecnico, Lisbon, Portugal, August 18-20, 2004. This was the fourth time that the two workshops were held back-to-back. The SSPR was the tenth International Workshop on Structural and Synt- tic Pattern Recognition, and the SPR was the ?fth International Workshop on Statistical Techniques in Pattern Recognition. These workshops have traditi- ally been held in conjunction with ICPR (International Conference on Pattern Recognition), and are the major events for technical committees TC2 and TC1, respectively, of the International Association for Pattern Recognition (IAPR). The workshops were closely coordinated, being held in parallel, with plenary talks and a common session on hybrid systems. This was an attempt to resolve thedilemmaofhowto dealwiththeneedfornarrow-focusspecializedworkshops yet accommodate the presentation of new theories and techniques that blur the distinction between the statistical and the structural approaches. A total of 219 papers were received from many countries, with the subm- sion and reviewing processes being carried out separately for each workshop. A total of 59 papers were accepted for oral presentation and 64 for posters. In - dition, four invited speakers presented informative talks and overviews of their research. They were: Alberto Sanfeliu, from the Technical University of Cata- nia, Spain; Marco Gori, from the University of Siena, Italy; Nello Cristianini, from the University of California, USA; and Erkki Oja, from Helsinki University of Technology, Finland, winner of the 2004 Pierre Devijver Award.

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops SSPR 2002 and SPR 2002,... Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002. Proceedings (Paperback, 2002 ed.)
Terry Caelli, Adnan Amin, Robert P.W. Duin, Mohamed Kamel, Dick De Ridder
R2,808 Discovery Miles 28 080 Ships in 18 - 22 working days

This book constitutes the refereed proceedings of the 9th International Workshop on Structural and Syntctic Pattern Recognition, SSPR 2002 and the 4th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2002 held jointly in Windsor, Ontario, Canada in August 2002.The 45 revised full papers and 35 poster papers presented together with three invited papers were carefully reviewed and selected from 116 submissions. The papers are organized in topical sections on graphs, grammars, and languages; graphs, strings, and grammars; documents and OCR; image shape analysis and application; density estimation and distribution models; multi classifiers and fusion; feature extraction and selection; general methodology; and image shape analysis and application.

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