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Digitally enhanced analog and mixed signal techniques are increasingly important to current and future circuit and system design. This book discusses how digital enhancement can be used to address key challenges relevant to analog components in terms of shrinking CMOS technology, increasing user demand for higher flexibility and data traffic in communications networks, and the drive to reduce power consumption. The book opens with an introduction to the main trends in current digitally enhanced systems, emphasising the impact of shrinking technology, and provides an overview of the principles of non-linear models. Later chapters cover pre-distortion and post-distortion techniques, analog-to-digital and digital-to-analog converters, clock generation, fixed-point refinement and adaptive filtering. Key themes of the book are the implementation approaches common between digital enhancement techniques and the trade-offs between complexity and performance for digitally enhanced devices and circuits. The book will be of particular interest to academic researchers and engineers working in analog and mixed signal circuit and system design.
The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for systema (TM)s performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain. Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCsa (TM) dynamic performance behaviour using sinusoidal stimuli. The three classical methods a" histogram, sine wave fitting, and spectral analysis a" are thoroughly described, and new approaches are proposed to circumvent some of their limitations. This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.
The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system's performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain. Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs' dynamic performance behaviour using sinusoidal stimuli. The three classical methods - histogram, sine wave fitting, and spectral analysis - are thoroughly described, and new approaches are proposed to circumvent some of their limitations. This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.
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