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Microelectronic Reliability, v. 2 - Integrity, Assessment and Assurance (Hardcover): Emiliano Pollino Microelectronic Reliability, v. 2 - Integrity, Assessment and Assurance (Hardcover)
Emiliano Pollino
R3,744 Discovery Miles 37 440 Ships in 18 - 22 working days

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

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