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Test Generation of Crosstalk Delay Faults in VLSI Circuits (Hardcover, 1st ed. 2019): S. Jayanthy, M.C. Bhuvaneswari Test Generation of Crosstalk Delay Faults in VLSI Circuits (Hardcover, 1st ed. 2019)
S. Jayanthy, M.C. Bhuvaneswari
R3,937 Discovery Miles 39 370 Ships in 12 - 17 working days

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems (Hardcover, 2015 ed.):... Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems (Hardcover, 2015 ed.)
M.C. Bhuvaneswari
R4,255 R3,252 Discovery Miles 32 520 Save R1,003 (24%) Ships in 12 - 17 working days

This book describes how evolutionary algorithms (EA), including genetic algorithms (GA) and particle swarm optimization (PSO) can be utilized for solving multi-objective optimization problems in the area of embedded and VLSI system design. Many complex engineering optimization problems can be modelled as multi-objective formulations. This book provides an introduction to multi-objective optimization using meta-heuristic algorithms, GA and PSO and how they can be applied to problems like hardware/software partitioning in embedded systems, circuit partitioning in VLSI, design of operational amplifiers in analog VLSI, design space exploration in high-level synthesis, delay fault testing in VLSI testing and scheduling in heterogeneous distributed systems. It is shown how, in each case, the various aspects of the EA, namely its representation and operators like crossover, mutation, etc, can be separately formulated to solve these problems. This book is intended for design engineers and researchers in the field of VLSI and embedded system design. The book introduces the multi-objective GA and PSO in a simple and easily understandable way that will appeal to introductory readers.

Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems (Paperback, Softcover... Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems (Paperback, Softcover reprint of the original 1st ed. 2015)
M.C. Bhuvaneswari
R3,276 Discovery Miles 32 760 Ships in 10 - 15 working days

This book describes how evolutionary algorithms (EA), including genetic algorithms (GA) and particle swarm optimization (PSO) can be utilized for solving multi-objective optimization problems in the area of embedded and VLSI system design. Many complex engineering optimization problems can be modelled as multi-objective formulations. This book provides an introduction to multi-objective optimization using meta-heuristic algorithms, GA and PSO and how they can be applied to problems like hardware/software partitioning in embedded systems, circuit partitioning in VLSI, design of operational amplifiers in analog VLSI, design space exploration in high-level synthesis, delay fault testing in VLSI testing and scheduling in heterogeneous distributed systems. It is shown how, in each case, the various aspects of the EA, namely its representation and operators like crossover, mutation, etc, can be separately formulated to solve these problems. This book is intended for design engineers and researchers in the field of VLSI and embedded system design. The book introduces the multi-objective GA and PSO in a simple and easily understandable way that will appeal to introductory readers.

Test Generation of Crosstalk Delay Faults in VLSI Circuits (Paperback, Softcover reprint of the original 1st ed. 2019): S.... Test Generation of Crosstalk Delay Faults in VLSI Circuits (Paperback, Softcover reprint of the original 1st ed. 2019)
S. Jayanthy, M.C. Bhuvaneswari
R3,988 Discovery Miles 39 880 Ships in 10 - 15 working days

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

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