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Showing 1 - 2 of 2 matches in All Departments

CTL for Test Information of Digital ICs (Hardcover, 2002 ed.)

Rohit Kapur

R2,977 Discovery Miles 29 770

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Ships in 10 - 15 working days

From the reviews: " ...] a welcome addition to the literature. ...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

CTL for Test Information of Digital ICs (Paperback, Softcover reprint of the original 1st ed. 2003)

Rohit Kapur

R2,842 Discovery Miles 28 420

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Ships in 10 - 15 working days

From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability