Welcome to Loot.co.za! Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search

Checkout
- Your Cart Price

Your cart

Your cart is empty

Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials

Buy Now

CTL for Test Information of Digital ICs (Hardcover, 2002 ed.) Loot Price: R3,129

Discovery Miles 31 290

Repayment Terms: R293 pm x 12*

Add to cart

CTL for Test Information of Digital ICs (Hardcover, 2002 ed.): Rohit Kapur

CTL for Test Information of Digital ICs (Hardcover, 2002 ed.)

Rohit Kapur

(sign in to rate)

Loot Price R3,129 Discovery Miles 31 290 | Repayment Terms: R293 pm x 12*

Expected to ship within 10 - 15 working days

Description
Details
Customer Reviews

From the reviews: " ...] a welcome addition to the literature. ...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	October 2002
First published:	2002
Authors:	Rohit Kapur
Dimensions:	235 x 155 x 12mm (L x W x T)
Format:	Hardcover
Pages:	173
Edition:	2002 ed.
ISBN-13:	978-1-4020-7293-2
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General Promotions
LSN:	1-4020-7293-7
Barcode:	9781402072932