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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials

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CTL for Test Information of Digital ICs (Hardcover, 2002 ed.) Loot Price: R2,977

Discovery Miles 29 770

Repayment Terms: R279 pm x 12*

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CTL for Test Information of Digital ICs (Hardcover, 2002 ed.): Rohit Kapur

CTL for Test Information of Digital ICs (Hardcover, 2002 ed.)

Rohit Kapur

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Loot Price R2,977 Discovery Miles 29 770 | Repayment Terms: R279 pm x 12*

Expected to ship within 10 - 15 working days

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Customer Reviews

From the reviews: " ...] a welcome addition to the literature. ...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	October 2002
First published:	2002
Authors:	Rohit Kapur
Dimensions:	235 x 155 x 12mm (L x W x T)
Format:	Hardcover
Pages:	173
Edition:	2002 ed.
ISBN-13:	978-1-4020-7293-2
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General Promotions
LSN:	1-4020-7293-7
Barcode:	9781402072932