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CTL for Test Information of Digital ICs (Hardcover, 2002 ed.) Loot Price: R2,748
Discovery Miles 27 480
Repayment Terms: R258 pm x 12*
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CTL for Test Information of Digital ICs (Hardcover, 2002 ed.): Rohit Kapur

CTL for Test Information of Digital ICs (Hardcover, 2002 ed.)

Rohit Kapur

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Loot Price R2,748 Discovery Miles 27 480 | Repayment Terms: R258 pm x 12*

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From the reviews: " ...] a welcome addition to the literature. ...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: October 2002
First published: 2002
Authors: Rohit Kapur
Dimensions: 235 x 155 x 12mm (L x W x T)
Format: Hardcover
Pages: 173
Edition: 2002 ed.
ISBN-13: 978-1-4020-7293-2
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
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LSN: 1-4020-7293-7
Barcode: 9781402072932

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