Using a qualitative, interview-based approach, Kim investigates how conflicting identities and social marginalization affect the mental health of members of the ethnic Korean minority living in Japan. So-called “Zainichi� Koreans living in Japan have a higher suicide rate than native Japanese, or than any other ethnic group within Japan, a country which has one of the highest suicide rates in the world. Considering themselves neither truly Korean nor wholly Japanese, they are mainly descendants of immigrants who came to Japan during the colonial period in the late 19th and early 20th centuries. Kim explores the challenges facing these individuals, including the dilemmas of ethnic education, the discrimination against them by mainstream society, and the consequent impacts on their mental health. An insightful read both for scholars of Japanese culture and society and for anthropologists and sociologists with an interest in the effects of marginalization on ethnic minority citizens more broadly.

Using a qualitative, interview-based approach, Kim investigates how conflicting identities and social marginalization affect the mental health of members of the ethnic Korean minority living in Japan. So-called "Zainichi" Koreans living in Japan have a higher suicide rate than native Japanese, or than any other ethnic group within Japan, a country which has one of the highest suicide rates in the world. Considering themselves neither truly Korean nor wholly Japanese, they are mainly descendants of immigrants who came to Japan during the colonial period in the late 19th and early 20th centuries. Kim explores the challenges facing these individuals, including the dilemmas of ethnic education, the discrimination against them by mainstream society, and the consequent impacts on their mental health. An insightful read both for scholars of Japanese culture and society and for anthropologists and sociologists with an interest in the effects of marginalization on ethnic minority citizens more broadly.

This book clarifies the fundamental difference between North America-based instrumental motivation and Korea (and East Asia)-specific competitive motivation by which the EFL learners' excessive competition to be admitted to famous universities and to be hired at a large-scale conglomerate is the main source of L2 motivation. It enables readers to understand that EFL-learning motivation reflects unique sociohistorical contexts grounded in a specific region or country. This book in turn necessitates the need to develop EFL motivation theory and research tradition which are firmly based on East Asian values and culture.

This volume highlights unique features of L2 teachers’ motivation, autonomy and career development in Far East counties (including Japan, South Korea and China), using diverse methodological research approaches incorporating both quantitative and qualitative paradigms. While much of current research focuses on students’ psychology, this volume looks into EFL teachers’ motivation and autonomy. Both discussions of theoretical issues of teacher motivation and autonomy and practical, classroom-based investigations are included and written to appeal to researchers, as well as applied teacher audiences. The theoretical chapters give readers a solid grounding in the issues of interest to the field. The practical chapters offer cutting edge insights and can also serve as templates on which postgraduate and postdoctoral researchers can base future studies. This helps the book to offer a dual service to the research community, addressing both issues of theorization of research and the practice of conducting research investigations.  

This book clarifies the fundamental difference between North America-based instrumental motivation and Korea (and East Asia)-specific competitive motivation by which the EFL learners' excessive competition to be admitted to famous universities and to be hired at a large-scale conglomerate is the main source of L2 motivation. It enables readers to understand that EFL-learning motivation reflects unique sociohistorical contexts grounded in a specific region or country. This book in turn necessitates the need to develop EFL motivation theory and research tradition which are firmly based on East Asian values and culture.

This volume highlights unique features of L2 teachers' motivation, autonomy and career development in Far East counties (including Japan, South Korea and China), using diverse methodological research approaches incorporating both quantitative and qualitative paradigms. While much of current research focuses on students' psychology, this volume looks into EFL teachers' motivation and autonomy. Both discussions of theoretical issues of teacher motivation and autonomy and practical, classroom-based investigations are included and written to appeal to researchers, as well as applied teacher audiences. The theoretical chapters give readers a solid grounding in the issues of interest to the field. The practical chapters offer cutting edge insights and can also serve as templates on which postgraduate and postdoctoral researchers can base future studies. This helps the book to offer a dual service to the research community, addressing both issues of theorization of research and the practice of conducting research investigations.

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.