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Using a qualitative, interview-based approach, Kim investigates how
conflicting identities and social marginalization affect the mental
health of members of the ethnic Korean minority living in Japan.
So-called “Zainichi” Koreans living in Japan have a higher
suicide rate than native Japanese, or than any other ethnic group
within Japan, a country which has one of the highest suicide rates
in the world. Considering themselves neither truly Korean nor
wholly Japanese, they are mainly descendants of immigrants who came
to Japan during the colonial period in the late 19th and early 20th
centuries. Kim explores the challenges facing these individuals,
including the dilemmas of ethnic education, the discrimination
against them by mainstream society, and the consequent impacts on
their mental health. An insightful read both for scholars of
Japanese culture and society and for anthropologists and
sociologists with an interest in the effects of marginalization on
ethnic minority citizens more broadly.
Using a qualitative, interview-based approach, Kim investigates how
conflicting identities and social marginalization affect the mental
health of members of the ethnic Korean minority living in Japan.
So-called "Zainichi" Koreans living in Japan have a higher suicide
rate than native Japanese, or than any other ethnic group within
Japan, a country which has one of the highest suicide rates in the
world. Considering themselves neither truly Korean nor wholly
Japanese, they are mainly descendants of immigrants who came to
Japan during the colonial period in the late 19th and early 20th
centuries. Kim explores the challenges facing these individuals,
including the dilemmas of ethnic education, the discrimination
against them by mainstream society, and the consequent impacts on
their mental health. An insightful read both for scholars of
Japanese culture and society and for anthropologists and
sociologists with an interest in the effects of marginalization on
ethnic minority citizens more broadly.
This book clarifies the fundamental difference between North
America-based instrumental motivation and Korea (and East
Asia)-specific competitive motivation by which the EFL learners'
excessive competition to be admitted to famous universities and to
be hired at a large-scale conglomerate is the main source of L2
motivation. It enables readers to understand that EFL-learning
motivation reflects unique sociohistorical contexts grounded in a
specific region or country. This book in turn necessitates the need
to develop EFL motivation theory and research tradition which are
firmly based on East Asian values and culture.
This volume highlights unique features of L2 teachers’
motivation, autonomy and career development in Far East counties
(including Japan, South Korea and China), using diverse
methodological research approaches incorporating both quantitative
and qualitative paradigms. While much of current research focuses
on students’ psychology, this volume looks into EFL teachers’
motivation and autonomy. Both discussions of theoretical issues of
teacher motivation and autonomy and practical, classroom-based
investigations are included and written to appeal to researchers,
as well as applied teacher audiences. The theoretical
chapters give readers a solid grounding in the issues of interest
to the field. The practical chapters offer cutting edge insights
and can also serve as templates on which postgraduate and
postdoctoral researchers can base future studies. This helps the
book to offer a dual service to the research community, addressing
both issues of theorization of research and the practice of
conducting research investigations.
This book clarifies the fundamental difference between North
America-based instrumental motivation and Korea (and East
Asia)-specific competitive motivation by which the EFL learners'
excessive competition to be admitted to famous universities and to
be hired at a large-scale conglomerate is the main source of L2
motivation. It enables readers to understand that EFL-learning
motivation reflects unique sociohistorical contexts grounded in a
specific region or country. This book in turn necessitates the need
to develop EFL motivation theory and research tradition which are
firmly based on East Asian values and culture.
This volume highlights unique features of L2 teachers' motivation,
autonomy and career development in Far East counties (including
Japan, South Korea and China), using diverse methodological
research approaches incorporating both quantitative and qualitative
paradigms. While much of current research focuses on students'
psychology, this volume looks into EFL teachers' motivation and
autonomy. Both discussions of theoretical issues of teacher
motivation and autonomy and practical, classroom-based
investigations are included and written to appeal to researchers,
as well as applied teacher audiences. The theoretical chapters give
readers a solid grounding in the issues of interest to the field.
The practical chapters offer cutting edge insights and can also
serve as templates on which postgraduate and postdoctoral
researchers can base future studies. This helps the book to offer a
dual service to the research community, addressing both issues of
theorization of research and the practice of conducting research
investigations.
This book provides readers with a detailed reference regarding two
of the most important long-term reliability and aging effects on
nanometer integrated systems, electromigrations (EM) for
interconnect and biased temperature instability (BTI) for CMOS
devices. The authors discuss in detail recent developments in the
modeling, analysis and optimization of the reliability effects from
EM and BTI induced failures at the circuit, architecture and system
levels of abstraction. Readers will benefit from a focus on topics
such as recently developed, physics-based EM modeling, EM modeling
for multi-segment wires, new EM-aware power grid analysis, and
system level EM-induced reliability optimization and management
techniques. Reviews classic Electromigration (EM) models, as well
as existing EM failure models and discusses the limitations of
those models; Introduces a dynamic EM model to address transient
stress evolution, in which wires are stressed under time-varying
current flows, and the EM recovery effects. Also includes new,
parameterized equivalent DC current based EM models to address the
recovery and transient effects; Presents a cross-layer approach to
transistor aging modeling, analysis and mitigation, spanning
multiple abstraction levels; Equips readers for EM-induced dynamic
reliability management and energy or lifetime optimization
techniques, for many-core dark silicon microprocessors, embedded
systems, lower power many-core processors and datacenters.
This book provides readers with a detailed reference regarding two
of the most important long-term reliability and aging effects on
nanometer integrated systems, electromigrations (EM) for
interconnect and biased temperature instability (BTI) for CMOS
devices. The authors discuss in detail recent developments in the
modeling, analysis and optimization of the reliability effects from
EM and BTI induced failures at the circuit, architecture and system
levels of abstraction. Readers will benefit from a focus on topics
such as recently developed, physics-based EM modeling, EM modeling
for multi-segment wires, new EM-aware power grid analysis, and
system level EM-induced reliability optimization and management
techniques. Reviews classic Electromigration (EM) models, as well
as existing EM failure models and discusses the limitations of
those models; Introduces a dynamic EM model to address transient
stress evolution, in which wires are stressed under time-varying
current flows, and the EM recovery effects. Also includes new,
parameterized equivalent DC current based EM models to address the
recovery and transient effects; Presents a cross-layer approach to
transistor aging modeling, analysis and mitigation, spanning
multiple abstraction levels; Equips readers for EM-induced dynamic
reliability management and energy or lifetime optimization
techniques, for many-core dark silicon microprocessors, embedded
systems, lower power many-core processors and datacenters.
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