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Ultraclean Surface Processing of Silicon Wafers - Secrets of VLSI Manufacturing (Hardcover, 1998 ed.): Takeshi Hattori Ultraclean Surface Processing of Silicon Wafers - Secrets of VLSI Manufacturing (Hardcover, 1998 ed.)
Takeshi Hattori; Translated by T. Hattori, S. Heusler, J.P. Webb
R9,403 R8,252 Discovery Miles 82 520 Save R1,151 (12%) Ships in 12 - 17 working days

A totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.

Ultraclean Surface Processing of Silicon Wafers - Secrets of VLSI Manufacturing (Paperback, Softcover reprint of hardcover 1st... Ultraclean Surface Processing of Silicon Wafers - Secrets of VLSI Manufacturing (Paperback, Softcover reprint of hardcover 1st ed. 1998)
Takeshi Hattori; Translated by T. Hattori, S. Heusler, J.P. Webb
R8,170 Discovery Miles 81 700 Ships in 10 - 15 working days

A totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.

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