Robust Technology with Analysis of Interference in Signal Processing discusses for the first time the theoretical fundamentals and algorithms of analysis of noise as an information carrier. On their basis the robust technology of noisy signals processing is developed. This technology can be applied to solving the problems of control, identification, diagnostics, and pattern recognition in petrochemistry, energetics, geophysics, medicine, physics, aviation, and other sciences and industries. The text explores the emergent possibility of forecasting failures on various objects, in conjunction with the fact that failures follow the hidden microchanges revealed via interference estimates. This monograph is of interest to students, postgraduates, engineers, scientific associates and others who are concerned with the processing of measuring information on computers.

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Robust Technology with Analysis of Interference in Signal Processing discusses for the first time the theoretical fundamentals and algorithms of analysis of noise as an information carrier. On their basis the robust technology of noisy signals processing is developed. This technology can be applied to solving the problems of control, identification, diagnostics, and pattern recognition in petrochemistry, energetics, geophysics, medicine, physics, aviation, and other sciences and industries. The text explores the emergent possibility of forecasting failures on various objects, in conjunction with the fact that failures follow the hidden microchanges revealed via interference estimates. This monograph is of interest to students, postgraduates, engineers, scientific associates and others who are concerned with the processing of measuring information on computers.

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.