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Computer Vision and Pattern Recognition (CVPR) together play an
important role in the processes involved in environmental
informatics due to their pervasive, non-destructive, effective, and
efficient natures. As a result, CVPR has made significant
contributions to the field of environmental informatics by enabling
multi-modal data fusion and feature extraction, supporting fast and
reliable object detection and classification, and mining the
intrinsic relationship between different aspects of environmental
data. Computer Vision and Pattern Recognition in Environmental
Informatics describes a number of methods and tools for image
interpretation and analysis, which enables observation, modelling,
and understanding of environmental targets. In addition to case
studies on monitoring and modeling plant, soil, insect, and aquatic
animals, this publication includes discussions on innovative new
ideas related to environmental monitoring, automatic fish
segmentation and recognition, real-time motion tracking systems,
sparse coding and decision fusion, and cell phone image-based
classification and provides useful references for professionals,
researchers, engineers, and students with various backgrounds
within a multitude of communities.
In this groundbreaking new volume, computer researchers discuss the
development of technologies and specific systems that can interpret
data with respect to domain knowledge. Although the chapters each
illuminate different aspects of image interpretation, all utilize a
common approach - one that asserts such interpretation must involve
perceptual learning in terms of automated knowledge acquisition and
application, as well as feedback and consistency checks between
encoding, feature extraction, and the known knowledge structures in
a given application domain. The text is profusely illustrated with
numerous figures and tables to reinforce the concepts discussed.
The aim of this book, originally published in 1984, was to bring
together a number of approaches to this important topic.
Significant advances had been made in the two decades before
publication in our understanding of many aspects of the coding that
occurs along the visual pathways. The major developments had been
associated with probing the nature of "logical" processes, whether
physiologically or psychophysically, and relatively less attention
had been devoted to the problem of how such locally coded knowledge
is put together to yield coherent representations of spatially (and
temporally) extended patterns - that is, to figural synthesis.
Thus, while a great deal was known about the responses of
individual cells in the visual system to controlled stimulation,
and about the specificity of the orientational and
spatial-frequency tuning of channels assessed psychophysically,
there had been much less discussion of how such knowledge could be
brought to bear on the general problems of understanding pattern
recognition.
In this groundbreaking new volume, computer researchers discuss the
development of technologies and specific systems that can interpret
data with respect to domain knowledge. Although the chapters each
illuminate different aspects of image interpretation, all utilize a
common approach - one that asserts such interpretation must involve
perceptual learning in terms of automated knowledge acquisition and
application, as well as feedback and consistency checks between
encoding, feature extraction, and the known knowledge structures in
a given application domain. The text is profusely illustrated with
numerous figures and tables to reinforce the concepts discussed.
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Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, SSPR 2004 and SPR 2004, Lisbon, Portugal, August 18-20, 2004 Proceedings (Paperback, 2004 ed.)
Ana Fred, Terry Caelli, Robert P.W. Duin, Aurelio Campilho, Dick De Ridder
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R4,485
Discovery Miles 44 850
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Ships in 10 - 15 working days
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This volume contains all papers presented at SSPR 2004 and SPR
2004, hosted by the Instituto de Telecomunicac" ,oes/Instituto
Superior T' ecnico, Lisbon, Portugal, August 18-20, 2004. This was
the fourth time that the two workshops were held back-to-back. The
SSPR was the tenth International Workshop on Structural and Synt-
tic Pattern Recognition, and the SPR was the ?fth International
Workshop on Statistical Techniques in Pattern Recognition. These
workshops have traditi- ally been held in conjunction with ICPR
(International Conference on Pattern Recognition), and are the
major events for technical committees TC2 and TC1, respectively, of
the International Association for Pattern Recognition (IAPR). The
workshops were closely coordinated, being held in parallel, with
plenary talks and a common session on hybrid systems. This was an
attempt to resolve thedilemmaofhowto
dealwiththeneedfornarrow-focusspecializedworkshops yet accommodate
the presentation of new theories and techniques that blur the
distinction between the statistical and the structural approaches.
A total of 219 papers were received from many countries, with the
subm- sion and reviewing processes being carried out separately for
each workshop. A total of 59 papers were accepted for oral
presentation and 64 for posters. In - dition, four invited speakers
presented informative talks and overviews of their research. They
were: Alberto Sanfeliu, from the Technical University of Cata- nia,
Spain; Marco Gori, from the University of Siena, Italy; Nello
Cristianini, from the University of California, USA; and Erkki Oja,
from Helsinki University of Technology, Finland, winner of the 2004
Pierre Devijver Award.
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Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002. Proceedings (Paperback, 2002 ed.)
Terry Caelli, Adnan Amin, Robert P.W. Duin, Mohamed Kamel, Dick De Ridder
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R2,956
Discovery Miles 29 560
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Ships in 10 - 15 working days
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This book constitutes the refereed proceedings of the 9th International Workshop on Structural and Syntctic Pattern Recognition, SSPR 2002 and the 4th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2002 held jointly in Windsor, Ontario, Canada in August 2002.The 45 revised full papers and 35 poster papers presented together with three invited papers were carefully reviewed and selected from 116 submissions. The papers are organized in topical sections on graphs, grammars, and languages; graphs, strings, and grammars; documents and OCR; image shape analysis and application; density estimation and distribution models; multi classifiers and fusion; feature extraction and selection; general methodology; and image shape analysis and application.
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