Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

This book presents the fundamentals of noise and its effect on the minimum detectable signal of mems transducers. The text will bring together the fundamental noise physics, device noise, and circuit noise with applications to MEMS transducers. Cases studies will compare noise floors of mems sensors employing different transduction mechanisms and illustrate design tradeoffs and scaling effects with miniaturization. The goal is to provide the reader with a basic understanding of the effect of device and circuit noise on the performance of mems transducers.