Strain Effect in Semiconductors - Theory and Device Applications (Paperback, 2010 ed.)

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	November 2014
First published:	2010
Authors:	Yongke Sun • Scott E. Thompson • Toshikazu Nishida
Dimensions:	235 x 155 x 19mm (L x W x T)
Format:	Paperback
Pages:	350
Edition:	2010 ed.
ISBN-13:	978-1-4899-8315-2
Categories:	Books > Science & Mathematics > Physics > States of matter > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	1-4899-8315-5
Barcode:	9781489983152

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