|
Showing 1 - 5 of
5 matches in All Departments
The international market is very competitive for high-tech
manufacturers to day. Achieving competitive quality and reliability
for products requires leader ship from the top, good management
practices, effective and efficient operation and maintenance
systems, and use of appropriate up-to-date engineering de sign
tools and methods. Furthermore, manufacturing yield and reliability
are interrelated. Manufacturing yield depends on the number of
defects found dur ing both the manufacturing process and the
warranty period, which in turn determines the reliability. the
production of microelectronics has evolved into Since the early
1970's, one of the world's largest manufacturing industries. As a
result, an important agenda is the study of reliability issues in
fabricating microelectronic products and consequently the systems
that employ these products, particularly, the new generation of
microelectronics. Such an agenda should include: * the economic
impact of employing the microelectronics fabricated by in dustry, *
a study of the relationship between reliability and yield, * the
progression toward miniaturization and higher reliability, and *
the correctness and complexity of new system designs, which include
a very significant portion of software.
Reliability, Yield, and Stress Burn-In explains reliability issues
in Microelectronics Systems Manufacturing and Software Development
with an emphasis on evolving manufacturing technology for the
semiconductor industry. Since most microelectronics components have
an infant mortality period of about one year under ordinary
operating conditions, and many modern systems, such as PCs, are
heavily used in the first few years, the reliability problem in the
infant mortality period becomes extremely important. Burn-in is an
accelerated screening procedure that eliminates infant mortalities
early on in the shop before shipping out the products to the
customers. This book will also help readers to analyze systems that
exhibit high failure rate during a long infant mortality period.
Reliability, Yield, and Stress Burn-In presents ways to
systematically analyze burn-in policy at the component, sub-system,
and system levels. Various statistical methods are addressed
including parametric, nonparametric, and Bayesian approaches. Many
case studies are introduced in combination with the developed
theories. Included in the book is an introduction to software
reliability. Reliability, Yield, and Stress Burn-In will help
manufacturers and system designers to understand and to design a
more reliable product given constraints specified by the users and
designers. An understanding of the infant mortality period will
solve many reliability problems, including those faced in the
semiconductor industry and software industry.
Optimal Reliability Design, first published in 2000, provides a
detailed introduction to systems reliability and reliability
optimization. Techniques for maximizing system reliability are
described, focusing on component reliability enhancement and
redundancy arrangement. The authors present several case studies
and show how optimization techniques are applied in practice. They
also pay particular attention to finding methods that give the
optimal trade-off between reliability and cost. The book begins
with a review of key background material, and a discussion of a
range of optimization models. The authors go on to cover
optimization tools, such as heuristics, discrete optimization,
nonlinear programming, mixed integer programming, optimal
arrangement, and metaheuristic algorithms. They also describe the
computational implementation of these tools. Many numerical
examples are included, and the book contains over 180 homework
exercises. It is suitable as a textbook for graduate-level courses
in reliability engineering and operations research. It will also be
a valuable reference for practising engineers.
Optimal Reliability Design is a detailed introduction to systems reliability and reliability optimization. State-of-the-art techniques for maximizing system reliability are described, focusing on component reliability enhancement and redundancy arrangement. The authors present several case studies and show how optimization techniques are applied in practice. They also pay particular attention to finding methods that give the optimal trade-off between reliability and cost. Chapters cover optimization tools such as heuristics, discrete optimization, nonlinear programming, mixed integer programming, optimal arrangement, and metaheuristic algorithms, and their computational implementation. Many numerical examples are included, as well as over 180 homework exercises. The book is suitable as a text for graduate-level courses in reliability engineering and operations research and as a valuable reference for practicing engineers.
|
You may like...
Roman
Cas Wepener
Paperback
R282
Discovery Miles 2 820
Book Lovers
Emily Henry
Paperback
(4)
R245
R192
Discovery Miles 1 920
New Times
Rehana Rossouw
Paperback
(1)
R250
R195
Discovery Miles 1 950
Still Life
Sarah Winman
Paperback
R358
Discovery Miles 3 580
Misverstand
Marita van der Vyver
Paperback
(2)
R320
R250
Discovery Miles 2 500
|